At-wavelength, system-level flare characterization of extreme-ultraviolet optical systems.
At-wavelength, system-level flare characterization of extreme-ultraviolet optical systems.
The extreme-ultraviolet (EUV) phase-shifting point-diffraction interferometer (PS/PDI) has recently been developed to provide high-accuracy wave-front characterization critical to the development of EUV lithography systems. Here we describe an enhanced implementation of the PS/PDI that significantly extends its measurement bandwidth. The enhanced PS/PDI is capable of […]